Scanning electron microscopes | Tenderlake

Scanning electron microscopes

Contract Value:
EUR 775K - 775K
Notice Type:
Contract award notice
Published Date:
02 March 2021
Closing Date:
Location(s):
FI1B Helsinki-Uusimaa (FI Finland/SUOMI / FINLAND)
Description:
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Biological Specimens

A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens.

A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens.

Awarded to:
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for biological Specimens
Carl Zeiss Oy, Vantaa (FI)
Download full details as .pdf
The Buyer:
University of Helsinki
CPV Code(s):
38511100 - Scanning electron microscopes