Scanning electron microscopes | Tenderlake

Scanning electron microscopes

Contract Value:
EUR 2M - 2M
Notice Type:
Contract award notice
Published Date:
07 November 2022
Closing Date:
Location(s):
DE212 München, Kreisfreie Stadt (DE Germany/DEUTSCHLAND)
Description:
Electron Beam Lithography System

This call for tender was for the purchase of an electron beam lithography system for the nanofabrication of devices, chips, structures and patterns required for research purposes. The system must be able to expose electron-sensitive resists in specific CAD designed patterns. We required a turn-key solution including all required hardware, software and peripheral devices necessary for system operation.

cf. II.1.4)

Awarded to:
Elionix, Inc., Tokyo (JP)
SEMTech Solutions, Inc., North Billerica (US)
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The Buyer:
Technische Universität München
CPV Code(s):
38511100 - Scanning electron microscopes