Analytical Equipment for JEOL ARM 200cF | Tenderlake

Analytical Equipment for JEOL ARM 200cF

Contract Value:
GBP 1M -
Notice Type:
Contract Notice
Published Date:
21 October 2024
Closing Date:
03 December 2024
Location(s):
UKD NORTH WEST (ENGLAND) (UK UNITED KINGDOM)
Description:
Replacement of analytical equipment for the JEOL ARM 200CF transmission electron microscope at NNL's Central Laboratory, including an electron energy-loss analysis system, imaging camera, and data integration system.
Analytical Equipment for JEOL ARM 200cF.
NNL operates the country’s only electron optics capability equipped for the analysis of irradiated fuel and structural components. This Procurement Specification covers the replacement of analytical equipment installed on the JEOL ARM 200CF transmission electron microscope (TEM) in NNL’s Central Laboratory. The equipment required is an electron energy-loss analysis system, an imaging
camera and a system that integrates the data capture with the microscope to produce spatially correlated datasets.

NNL operates the country’s only electron optics capability equipped for the analysis of irradiated fuel and structural components. This Procurement Specification covers the replacement of analytical equipment installed on the JEOL ARM 200CF transmission electron microscope (TEM) in NNL’s Central Laboratory. The equipment required is an electron energy-loss analysis system, an imaging
camera and a system that integrates the data capture with the microscope to produce spatially correlated datasets.
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The Buyer:
National Nuclear Laboratory
Additional information:
Link:
View Notice Source
Link:
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CPV Code(s):
38000000 - Laboratory, optical and precision equipments (excl. glasses)
38510000 - Microscopes
38511000 - Electron microscopes
38511100 - Scanning electron microscopes
38511200 - Transmission electron microscope
38512000 - Ion and molecular microscopes
38512100 - Ion microscopes
38519500 - Laboratory microscope replacement bulbs