    
                        Instruments for checking physical characteristics
                    
                                Contract Value:
                                EUR 1M - 1M
                                Notice Type:
                                Contract Notice
                            
                                Published Date:
                                31 January 2020
                                Closing Date:
                                16 March 2020
                            
                                Location(s):
                                        LV00 Latvija (LV Latvia/LATVIJA)
                            
                        Description:
                        
                        High resolution scanning electron and ion beam microscope (SEM / FIB) 
 High resolution scanning electron and ion beam microscope (SEM / FIB). 
 High resolution scanning electron and ion beam microscope (SEM / FIB). 

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                            The Buyer:
                            Latvijas Universitātes Cietvielu fizikas institūts
                            
                            CPV Code(s):
                                38400000 - Instruments for checking physical characteristics