NPL has a requirement for a scattering-type near-field optical microscope (VIS-neaSCOPE) that enables simultaneous background-free imaging and spectroscopy on nanometre length scales in the visible range.

A scattering-type near-field optical microscope (VIS-neaSCOPE) that enables simultaneous background-free imaging and spectroscopy on nanometre length scales in the visible range.

- Patented parabolic mirror design for focusing and collection of light

- Patented dual-port design to allow two beams of light to be focused on the atomic force microscope (AFM) tip for nanoscale imaging and spectroscopy

- Patented signal processing for optical background suppression

- Patented pseudo-heterodyne detection (PsHEt) technology for background suppression

- Patented interferometric design (nano-FTIR) for background-free optical detection technology and simultaneous detection of optical amplitude and phase and hyperspectral imaging

- Patented high speed holography (HSH) for multispectral imaging

- Patened phase shifting (PhS) detection to extract relative phase

- Optimised scanning probe microscope system that can be combined with mechanical and electrical measurements

- Built-in optical imaging and spectroscopy software modules, as well as data visualisation and analysis software

- Position sensors for motorised parabolic mirror axes to enable alignment-free focusing of a laser beam to the AFM tip

- Visible and NIR illumination units, which can be integrated and coupled into both the room-temperature and cryogenic temperature s-SNOM system.