Scanning electron microscopes | Tenderlake

Scanning electron microscopes

Contract Value:
-
Notice Type:
Contract Notice
Published Date:
25 June 2021
Closing Date:
05 August 2021
Location(s):
CH0 SCHWEIZ/SUISSE/SVIZZERA (CH Switzerland/SCHWEIZ/SUISSE/SVIZZERA)
Description:
Analytical Scanning Electron Microscope

The analytical scanning electron microscope must provide different imaging modalities and advanced analytical capabilities (EDS and EBSD) for detailed characterisation of different materials and at different length scales. The new instrument will be a multi-user and multi-purpose microscope, allowing easy switching between different modes of operation.

The analytical scanning electron microscope must provide different imaging modalities and advanced analytical capabilities (EDS and EBSD) for detailed characterisation of different materials and at different length scales. The new instrument will be a multi-user and multi-purpose microscope, allowing easy switching between different modes of operation.

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The Buyer:
Empa
CPV Code(s):
38511100 - Scanning electron microscopes