SUPPLY, INSTALLATION AND COMMISSIONING OF A FOCUSED ION BEAM MICROSCOPE (FIB) COMBINED WITH A SCANNING ELECTRON MICROSCOPE (SEM) FOR SAMPLE PREPARATION FOR ELECTRON MICROSCOPY
TELEMATICS OPEN PROCEDURE FOR THE AWARDING OF THE SUPPLY, INSTALLATION AND COMMISSIONING OF A FOCUSED ION BEAM MICROSCOPE (FIB) COMBINED WITH A SCANNING ELECTRON MICROSCOPE (SEM) FOR THE PREPARATION OF SAMPLES FOR ELECTRON MICROSCOPY
CIG 9902598A60- CUP B53C22004310006