Scanning electron microscopes | Tenderlake

Scanning electron microscopes

Contract Value:
EUR 830K - 830K
Notice Type:
Contract Notice
Published Date:
14 November 2023
Closing Date:
19 December 2023
Location(s):
ITG17 Catania (IT Italy/ITALIA)
Description:
SUPPLY OF A SCANNING ELECTRON MICROSCOPE WITH FIELD EMISSION SOURCE (FEG-SEM) EQUIPPED WITH EDS MICROANALYSIS SYSTEM AND DETECTOR FOR BACKSCATTERED ELECTRONS (EBSD)_CIG A02804D568

ASSIGNMENT OF THE SUPPLY, INSTALLATION AND OPERATIONAL PERFORMANCE OF A "HIGH RESOLUTION ANALYTICAL SCANNING ELECTRON MICROSCOPE WITH FIELD EMISSION SOURCE (FEG-SEM) EQUIPPED WITH ENERGY DISPERSIVE MICROANALYSIS (EDS) SYSTEM AND DETECTOR FOR BACKSCATTERED ELECTRON DIFFRACTION (EBSD)"_ iENTRANCE - CUP B33C22000710006_ CIG A02804D568 PROJECT

ASSIGNMENT OF THE SUPPLY, INSTALLATION AND OPERATIONAL PERFORMANCE OF A "HIGH RESOLUTION ANALYTICAL SCANNING ELECTRON MICROSCOPE WITH FIELD EMISSION SOURCE (FEG-SEM) EQUIPPED WITH ENERGY DISPERSIVE MICROANALYSIS (EDS) SYSTEM AND DETECTOR FOR BACKSCATTERED ELECTRON DIFFRACTION (EBSD)"_ iENTRANCE - CUP B33C22000710006_ CIG A02804D568 PROJECT

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The Buyer:
Istituto per la Microelettronica e Microsistemi - Consiglio Nazionale delle Ricerche
CPV Code(s):
38511100 - Scanning electron microscopes