For the investigation of cross-sections on the microstructure of MEAs based on electroceramic thin films of new low precious metal catalysts, high-entropy alloys and powdery ceramic materials used in ammonia synthesis technologies or for ammonia use as fuel, are essential for the development of these new nanomaterials and their manufacturing processes.
In addition, coated steel samples and components are examined in a cross-section microscope in order to investigate post-mortem degradation processes (after operation in ammonia or hydrogen) and to draw important conclusions regarding the service life and degradation mechanisms of materials and components.
Scanning electron microscope (abbreviation: 1)Field emission source with possible jet current min. 20 nA
acceleration voltage from maximum 0.1 kV up to at least 30 kV
Beam resolution at 15 kV < 1 nm, if possible beam resolution < 2 nm at 1 kV
possibility of reducing landing energy (beam decceleration)
motorized, eucentric sample table, tiltable up to 45°
multiple sample holder, cross section sample holder
- magnification at least 300,000x
SE detectors (ETSE detector and in-lens detector)
high-resolution BSE detector (chamber and/or in-lens)
PlasmaCleaning to remove hydrocarbons from samples
possible sample size of 100 mm
oil-free pumping system
- water cooling
vibration damping
Control panel/control, PC, monitor, table, software, peripherals (mouse, keyboard)
Analytics - EDX detector (short sign: 2)EDX detector, cross section approx. 30 mm
resolution at least 129 eV Mn Kα
200 kcps count rate
incl. flange/attachment and mechanism for retracting and extending
incl. control, PC, monitor, software (point spectrum, line scan, mapping, indexing and quantification), peripherals (mouse, keyboard)