Scanning electron microscopes | Tenderlake

Scanning electron microscopes

Contract Value:
EUR 984K - 984K
Notice Type:
Contract Notice
Published Date:
28 June 2023
Closing Date:
24 July 2023
Location(s):
DE300 Berlin (DE Germany/DEUTSCHLAND)
Description:
High- and low-resolution high- and low-resolution analytical FE-SEM for imaging, EBSD (TKD) and EDX in high and low vacuum

High-performance analytical FE-SEM with high and low resolution for imaging, EBSD (TKD) and EDX in high and low vacuum according to specifications and tender documents

High-performance analytical FE-SEM with high and low resolution for imaging, EBSD (TKD) and EDX in high and low vacuum according to specifications and tender documents

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The Buyer:
Bundesanstalt für Materialforschung und -prüfung (BAM)
CPV Code(s):
38511100 - Scanning electron microscopes