Scanning electron microscope (SEM) for topographical analysis of nanostructures with a resolution below 1 nm.

A scanning electron microscope (SEM) will be procured. The SEM should enable the topographical analysis of metallic nanostructures on various substrates with a resolution of less than 1 nm. The SEM should also enable the investigation of nanostructured paint systems with acceleration voltages below 1 kV without being impaired by charging effects, as well as the investigation of magnetic structures.

The SEM should be equipped with a low-maintenance Schottky emitter. The resolution should be less than 0.5 nm at 15 kV and less than 0.8 nm at 1 kV.

Exclusion criteria with regard to the technical specifications are:

- the maximum floor space is 300 cm x 200 cm, the room height is 330 cm,

- To install the system, all components must fit through a door opening of 200 cm x 94.5 cm,

- the delivery time must not be longer than 6 months.