Procurement of a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) with analytical detectors and specimen coater for high-resolution imaging and analysis at the National Museums Collection Centre in Edinburgh.
NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater
This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors (CL, EDX, WDS, EBDSD) and specimen coater (C/Pt) to enable high-resolution imaging and analysis which can be used in concert at the National Museums Collection Centre in Edinburgh to study a wide range of collections.
VARIABLE PRESSURE FIELD-EMISSION GUN SEM (VP FEG-SEM)
Please see attached tender documentation for full details.
A) TRANSFER OF EXISTING EDX SYSTEM & SOFTWARE UPGRADE; OR B) A NEW EDX SYSTEM; AS WELL AS A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER AND ELECTRON BACKSCATTER DIFFRACTION MICROANALYSIS SYSTEM
Please see attached tender documentation for full details.
SPECIMEN COATER (C/Pt)
Please see attached tender documentation for full details.
RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL)
Please see attached tender documentation for full details.