Contract for the supply, installation and start-up of a transmission electron microscope with aberration correctors (AC- (S) TEM) and a focused ion beam system (FIB), divided into two lots for the Institut Català de Nanociència i Nanotechnology (ICN2).
Supply, installation and commissioning of a transmission electron microscope with aberration correctors (AC- (S) TEM)The purpose of this document is to define the technical and functional characteristics that will govern the contracting of the supply, installation and commissioning of a transmission electron microscope with aberration correctors (hereinafter, AC- (S) TEM) for the Institut Català de Nanociència i Nanotecnologia (hereinafter ICN2). File 2020-28 ICN2 (lot 1).
Supply, installation and commissioning of a focused ion beam system (FIB), divided into two batches for the Institut Català de Nanociència i Nanotecnologia (ICN2)The purpose of this document is to define the technical and functional characteristics that will govern the contracting of the supply, installation and start-up of a focused ion beam system (hereinafter FIB) for the Institut Català de Nanociència i Nanotecnologia (hereinafter, ICN2 ). File 2020-28 ICN2 (lot 2).