ASSIGNMENT OF THE SUPPLY, INSTALLATION AND OPERATIONAL PERFORMANCE OF "SYSTEMS FOR THE DETERMINATION OF THE ELECTRICAL PROPERTIES OF MATERIALS DIVIDED INTO 2 LOTS"_ LOT 1 "ELECTRICAL ANALYSIS SYSTEM WITH MERCURY PROBE" CIG A020A982DF; LOT 2 "HALL MEASUREMENT SYSTEM WITH MODALITIES THAT DO NOT INVOLVE CONTACT WITH THE WAFER" CIG A020AB7C71_ iENTRANCE CUP Project B33C22000710006
LOT 1 "ELECTRICAL ANALYSIS SYSTEM WITH MERCURY PROBE" CIG A020A982DFASSIGNMENT OF THE SUPPLY, INSTALLATION AND OPERATIONAL PERFORMANCE OF "SYSTEMS FOR THE DETERMINATION OF THE ELECTRICAL PROPERTIES OF MATERIALS DIVIDED INTO 2 LOTS": LOT 1 "ELECTRICAL ANALYSIS SYSTEM WITH MERCURY PROBE" CIG A020A982DF; LOT 2 "HALL MEASUREMENT SYSTEM WITH MODALITIES THAT DO NOT INVOLVE CONTACT WITH THE WAFER" CIG A020AB7C71;_ Project iENTRANCE CUP B33C22000710006
LOT 2 "HALL MEASUREMENT SYSTEM WITH MODALITIES THAT DO NOT INVOLVE CONTACT WITH THE WAFER" CIG A020AB7C71ASSIGNMENT OF THE SUPPLY, INSTALLATION AND OPERATIONAL PERFORMANCE OF "SYSTEMS FOR THE DETERMINATION OF THE ELECTRICAL PROPERTIES OF MATERIALS DIVIDED INTO 2 LOTS": LOT 1 "ELECTRICAL ANALYSIS SYSTEM WITH MERCURY PROBE" CIG A020A982DF; LOT 2 "HALL MEASUREMENT SYSTEM WITH MODALITIES THAT DO NOT INVOLVE CONTACT WITH THE WAFER" CIG A020AB7C71_ IENTRANCE - CUP PROJECT B33C22000710006