This call for tenders was for the procurement of a Focussed Ion Beam System with integrated Scanning Electron Microscope (FIB-SEM), with priority on the Focussed Ion Beam functionality and electron microscopy only in a supporting role. The instrument must be optimised for nanopatterning applications. Analytical functions are desirable, but on a lower priority level. The offered instrument must be a turn-key solution.

See II.1.4)