The department of Materials Science and Engineering of the faculty of 3ME of Delft University of Technology (hereafter TU-Delft) is planning to acquire a new analytical Scanning Electron Microscope (SEM) facility that should include EDS (Energy Dispersive Spectroscopy) and EBSD (Electron Back-Scatter Diffraction).

the combination of the JSM-IT800SHL FEG-SEM system offered by JEOL combined with the Oxford Instruments AztecLive Advanced Ultim Max 100mm² combined with Oxford Instruments AztecHKL Advanced EBSD system with Symmetry S3,