specifications

The tender is a new device for measuring X-ray scattering, in particular but not exclusively for X-ray diffraction (XRD) and X-ray reflectometry (XRR) on thin, epitaxial layers in order to e.g. B. to determine grid parameters and layer thicknesses. We are looking for a complete system that includes a radiation protection housing corresponding to a full protection device, a precise four-circle goniometer with Euler cradle and in-plane arm, an X-ray source including optics for a monochromatic and highly intensive X-ray beam, a holder for samples of 1x1 mm 2 up to wafers with a diameter of 200 mm, an additional sample holder for measurements at variable temperatures from -180 degrees C to +200 degrees C, a powerful 2D detector for fast sample adjustment and fast reciprocal grid maps, additional equipment for flexible use, a stable one Includes computer and software systems for device control, data acquisition, and data analysis and simulation. Installation and further support must also be guaranteed. The IHP reserves the right that the technical requirements must be proven by means of test measurements.

specifications

The tender is a new device for measuring X-ray scattering, in particular but not exclusively for X-ray diffraction (XRD) and X-ray reflectometry (XRR) on thin, epitaxial layers in order to e.g. B. to determine grid parameters and layer thicknesses. We are looking for a complete system that includes a radiation protection housing corresponding to a full protection device, a precise four-circle goniometer with Euler cradle and in-plane arm, an X-ray source including optics for a monochromatic and highly intensive X-ray beam, a holder for samples of 1x1 mm 2 up to wafers with a diameter of 200 mm, an additional sample holder for measurements at variable temperatures from -180 degrees C to +200 degrees C, a powerful 2D detector for fast sample adjustment and fast reciprocal grid maps, additional equipment for flexible use, a stable one Includes computer and software systems for device control, data acquisition, and data analysis and simulation. Installation and further support must also be guaranteed. The IHP reserves the right that the technical requirements must be proven by means of test measurements.