This procurement is divided into 2 separate tender areas A and B; the supply of a high-resolution Field Emission Scanning Electron Microscope (FE-SEM, also commonly abbreviated as FEG-SEM or FE-SEM) with attached Focus Ion Beam capability (FIB) as specified in the attached documentation and the supply of a Broad Argon Ion Beam Milling System with the capability of conductive coating as specified in the attached documentation.