The Paul Scherrer Institute will purchase an electron energy filter for a 200 kV (scanning) JEOL JEM-F200 transmission electron microscope. The filter is mainly used for data acquisition in imaging and diffraction modes, using detectors that were and are developed at PSI. The energy filter serves 2 purposes:

(i) reducing the signal of inelastically scattered electrons and

(ii) Bending the electron beam, allowing significant post-column magnification by inserting a flight tube between the energy filter and a detector. For details see specification PSI-AA24-001 Rev 1.00.

The Paul Scherrer Institute will purchase an electron energy filter for a 200 kV (scanning) JEOL JEM-F200 transmission electron microscope. The filter is mainly used for data acquisition in imaging and diffraction modes, using detectors that were and are developed at PSI. The energy filter serves 2 purposes:

(i) reducing the signal of inelastically scattered electrons and

(ii) Bending the electron beam, allowing significant post-column magnification by inserting a flight tube between the energy filter and a detector. For details see specification PSI-AA24-001 Rev 1.00