ASSIGNMENT OF THE SUPPLY OF MICROSCOPES DIVIDED INTO 2 FUNCTIONAL LOTS - Lot 1 SPM microscope for high vacuum electrical measurements CIG A01482B0E5_ Lot 2 Scanning probe microscope with NV CIG centers A01485FBCB_ iENTRANCE CUP Project B33C22000710006
ASSIGNMENT OF THE SUPPLY OF MICROSCOPES DIVIDED INTO 2 FUNCTIONAL LOTS - Lot 1 SPM microscope for electrical measurements in high vacuum CIG A01482B0E5ASSIGNMENT OF THE SUPPLY OF MICROSCOPES DIVIDED INTO 2 FUNCTIONAL LOTS - Lot 1 SPM microscope for high vacuum electrical measurements CIG A01482B0E5_ Lot 2 Scanning probe microscope with NV CIG centers A01485FBCB_ iENTRANCE CUP Project B33C22000710006
ASSIGNMENT OF THE SUPPLY OF MICROSCOPES DIVIDED INTO 2 LOTS FUNZIONALI_ LOT 2 Scanning probe microscope with CIG A01485FBCB centers NV_ASSIGNMENT OF THE SUPPLY OF MICROSCOPES DIVIDED INTO 2 LOTS FUNZIONALI_ Lot 1 : SPM microscope for electrical measurements in high vuoto_ CIG A01482B0E5_Lotto 2 : Scanning probe microscope with CIG NV_ centers A01485FBCB_ iEntrance CUP Project B33C22000710006