Scanning probe microscopes | Tenderlake

Scanning probe microscopes

Contract Value:
-
Notice Type:
Contract Notice
Published Date:
25 August 2023
Closing Date:
25 September 2023
Location(s):
DE21H München, Landkreis (DE Germany/DEUTSCHLAND)
Description:
Atomic force microscope for local electronic and electrochemical characterization

Delivery and installation (incl. training) of an atomic force microscope for the local investigation of local material properties and electrochemical reaction processes on semiconductor photoelectrodes for solar energy conversion.

The subject of the contract is the delivery and installation (including training) of an atomic force microscope for the local characterization of materials for (photo)electrochemical energy conversion. The special focus is on the electrochemical and electronic investigation of photoelectrodes as well as their internal and external interfaces, so that special requirements are placed on the resolution for the characterization under reaction conditions as well as for the analysis of semiconductor properties (see specification).

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The Buyer:
Technische Universität München
CPV Code(s):
38514200 - Scanning probe microscopes