Delivery and commissioning of a field emission scanning electron microscope equipped for detection, indexing and processing of bent backscatter electrons (EBSD), energy-dispersive X-ray spectra (EDS) and cathodolum emission (CL) as well as magnetic field compensation for the large device.

New field-free field emission scanning electron microscope (SEM) with new EBSD, EDX and CL detection systems, necessary equipment including delivery installation and commissioning

The new field emission scanning electron microscope (SEM) is the most important analyzer in the Geodynamics department. It will be of major importance for all four geoscience working groups of the Institute for Geosciences and Geography in research as well as in teaching. Various new applications are also opening up for soil science.

Implementation of electromagnetic shielding: via a frame around the column or parts to be shielded so that the SEM can be operated within the manufacturer's specification.