The subject of the order is the Delivery of a scanning electron microscope with an EDS microanalyzer for the needs of Instytut Agrofizyki im. B. Dobrzański Polish Academy of Sciences in Lublin.

A detailed description of the subject of the order is attached as Annex 1 to this ToR. Source of financing - Project entitled The effect of minerals and various forms of organic carbon on the structure, porosity and mechanical and water stability of soil aggregates - model research, financed by the National Center as part of the OPUS 15 competition, contract number: UMO-2018/29 / B / ST10 / 01592.

1 Scanning electron microscope.

1.1. A microscope equipped with an electron gun with electron emission.

1.2 Obligatory (maximum) time allowed by the Employer to obtain an electronic image counted from the time of inserting the preparation into the chamber is 5 minutes.

1.3 Obligatory (maximum) allowable by the Employer the weight of the device is 300 kg.

1.4 The system must contain all necessary connections and elements to guarantee its full functionality.

1.5 The system must be equipped with at least one USB port.

1.6 The microscope must be equipped with a detector for direct detection of backscattered electrons (BSE).

1.7. The microscope must be equipped with a secondary electron detector (SE).

1.8. The microscope must allow operation at accelerating voltage in the range of at least up to 20 kV with a step adjustment of not more than 1 kV.

1.9. The microscope resolution of backscattered electrons at 10 kV accelerating voltage shall not be lower than 10 nm, for secondary electrons not lower than 8 nm.

1.10 The microscope system must enable digital recording of microscopic images with a resolution of not less than 2048 x 2048 pixels.

1.11. The microscope must allow electron images to be obtained at magnifications up to a minimum of 150,000x.

1.12. The microscope must be equipped with a table with automation in the X and Y axes, controlled from the main graphic user interface of the microscope.

1.13 The system must contain a CCD camera for observing the inside of the microscope chamber.

1.14 Labels of received photos must contain at least: pitch in μm, magnification, type of signal.

1.15 Image recording should include JPG, BMP, TIF formats.

1.16 The microscope control system must include automatic focus, brightness, contrast and astigmatism correction functions.

1.17. The microscope must contain embedded control software and specialized applications that allow measurements and processing of the images obtained, including in particular analysis of particle size and shape, calculation of means, medians, circumference, diameter, and histogram generation.

1.18. The microscope must be able to add additional software modules in the future enabling, among others, three-dimensional image creation.

1.19. The microscope must be capable of testing conductive and non-conductive samples without the need for dusting.

1.20. The microscope must enable the testing of preparations in low and high vacuum.

1.21. Adjustable pressure in low vacuum mode in the range from no more than 10 Pa to at least 60 Pa.

1.22 The size of the samples in the microscope chamber shall be: diameter at least 20 mm, height at least 20 mm.

2 EDS detector

2.1. The microscope must be equipped with an EDS X-ray microanalysis system for analysis of the chemical composition of the tested surfaces, fully adapted to cooperate with the offered SEM microscope

2.2 The system must be equipped with specialized EDS analysis software in the form of point analysis, area average, mapping and linear analysis. The software must enable automatic identification of the peak, the results should be presented as a percentage share (by weight or atomic)

2.3 The EDS software must allow all data to be exported to popular formats such as doc. Xls. e.t.c.

2.4 The EDS detector must be made in SDD technology (Silicon Drit Detector), which does not require liquid nitrogen cooling

2.5 The resolution of the detector is to be not worse than 132 Ev for the MnK-alpha line

2.6. The surface area of the detector shall be not less than 25 mm2

2.7 The elements analyzed are to range from at least C to U

2.8 EDS is to be fully integrated with the microscope and work using one keyboard and mouse for SEM and EDS

3 Stationary control unit (Detailed description in Annex 1 to this SIWZ).

4 Consumable parts (Detailed description in attachment 1 to this ToR).

5 Additional requirements (Detailed description in Attachment 1 to this ToR).