To enhance the research facilities available, the University of York is looking to acquire an X-Ray Diffractometer.

The XRD is required primarily for use on magnetic thin films but also with the capability to undertake powder diffraction. The primary use of the system will be the determination of structure of ferromagnetic and non-magnetic thin films with typical thicknesses of 10nm but there is also a requirement to examine the crystallinity of ultrathin (1.2nm) layers of MgO in spin tunnel junction stacks. These are buried layers.

This contract is for the supply and install of the equipment and the provision of a service/maintenance contract for the following years.