This procurement is divided into 2 separate tender areas A and B; the supply of a high-resolution Field Emission Scanning Electron Microscope (FESEM, also commonly abbreviated as FEG-SEM or FE-SEM) with attached Focus Ion Beam capability (FIB) as specified in the attached documentation, and the supply of a Broad Argon Ion Beam milling system with the capability of conductive coating as specified in the attached documentation.