The object of the order includes a high-resolution field emission scanning electron microscope with electron beam microanalysis including the necessary peripherals for proper use.
Through its R&D work in its 5 research areas, INNOVENT has an exceptionally diverse sample spectrum. This includes a great variety both in material terms and in terms of sample properties in terms of size and possibility or limitation of sample preparation and dimensioning. Therefore, the device should combine a high flexibility in sample volume with high imaging and analysis performance. The device is to be used in the field of cultural property protection, microelectronics, coating, inorganic materials, magnetic materials, nanoparticles, damage cases and biomaterials.
For these very different applications, it is necessary that the device can have an extensive range of services (see specifications).
Please note: Innovent e.V. is NOT a public client according to § 98 ff. GWB, but must carry out the intended procurement under the provisions of public procurement law as a result of the use of subsidies in accordance with the Funding Directive or the funding conditions.
The object of the order includes a high-resolution field emission scanning electron microscope with electron beam microanalysis including the necessary peripherals for proper use.
Through its R&D work in its 5 research areas, INNOVENT has an exceptionally diverse sample spectrum. This includes a great variety both in material terms and in terms of sample properties in terms of size and possibility or limitation of sample preparation and dimensioning. Therefore, the device should combine a high flexibility in sample volume with high imaging and analysis performance. The device is to be used in the field of cultural property protection, microelectronics, coating, inorganic materials, magnetic materials, nanoparticles, damage cases and biomaterials.
For these very different applications, it is necessary that the device ensures the highest possible resolution (e.B. for nanoparticles, thin layers in the cross-section and in the fracture surface) on the one hand, but on the other hand also very large samples (e.B. cultural goods) can be examined undestroyed. In addition to a large chamber for navigation and the largest possible sample area to be examined, the latter requires the largest possible field of view and the possibility of imaging very large sample areas with high pixel resolution.
In addition, it should be possible to switch quickly and easily between imaging mode with the SEM and elemental analysis using EDX.
The device must be user-friendly to use in order to be able to use safely and quickly even by users with less experience.
Estimated cost of positions one to five €500,000.00
1. Specifications scanning electron microscope
1.1. Leistungsverzeichnis EDX-System
2. Service
3. Warranty, warranty, spare parts
4. Availability of services
5. Delivery, documentation, instruction
The exact description of the requirements can be found in the separate files for the specifications, as well as the award conditions. Only offers that correspond to the required delivery services in the specifications
Taken into account.