3D LIT-OBIRCH System (IMWS-2.1) + Scanning Electron Microscope with Ultrafast E-beam Operation (IMWS-3.1) - PR876527-2690-P | Tenderlake

3D LIT-OBIRCH System (IMWS-2.1) + Scanning Electron Microscope with Ultrafast E-beam Operation (IMWS-3.1) - PR876527-2690-P

Contract Value:
-
Notice Type:
Contract Notice
Published Date:
14 May 2025
Closing Date:
27 May 2025
Location(s):
DEE02 Halle (Saale), Kreisfreie Stadt (DE Germany/DEUTSCHLAND)
Description:

3D LIT-OBIRCH System (IMWS-2.1) + Scanning Electron Microscope with Ultrafast E-beam Operation (IMWS-3.1)

3D LIT-OBIRCH System (IMWS-2.1) + Scanning Electron Microscope with Ultrafast E-beam Operation (IMWS-3.1)


LOT-0001
Lot 1: 3D LIT-OBIRCH System (IMWS-2.1).
The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behavior, reliability, safety, and lifespan of innovative materials in components and systems. The

The Buyer:
Fraunhofer-Gesellschaft - Einkauf B12
Additional information:
Link:
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Additional document: TenderDoc
CPV Code(s):
38511100 - Scanning electron microscopes
38512100 - Ion microscopes