A high-resolution X-ray diffractometer with integrated Euler cradle and horizontal sample acquisition is to be procured for the characterization of single-crystalline semiconductor structures of different compositions based on the substrates GaAs, InP and GaSb.

LOT-0001
high-resolution X-ray diffractometer.
A high-resolution X-ray diffractometer with integrated Euler cradle and horizontal sample acquisition is to be procured for the characterization of single-crystalline semiconductor structures of different compositions based on the substrates GaAs, InP and GaSb.