Probing Station Equipment (“PROBE SYSTEM”) for Optical, DC, and Automatic RF Characterization at Temperature for 8” Wafers | Tenderlake

Probing Station Equipment (“PROBE SYSTEM”) for Optical, DC, and Automatic RF Characterization at Temperature for 8” Wafers

Contract Value:
EUR 572K - 572K
Notice Type:
Contract Notice
Published Date:
21 October 2025
Closing Date:
04 November 2025
Location(s):
ES523 Valencia / València (ES Spain/ESPAÑA)
Description:
The Nanophotonics Technology Institute seeks to acquire semi-automatic hybrid electro-optical characterization equipment for testing electronic and photonic devices, enhancing capabilities for research and development in high-speed telecommunications and advanced circuit testing.

The Nanophotonics Technology Institute (NTC) of UPV is proposing the acquisition of a semi-automatic hybrid electro-optical characterization equipment, capable of up to 110GHz in a temperature range of -40 degrees to 200 degrees. This technology is key in the verification and testing process of electronic and photonic devices created in the institute's own facilities (Cleanroom) or providing services to external devices, thus closing the cycle in the development of integrated circuits.
This equipment significantly enhances our capabilities as it allows testing circuits from a few millimeters in size to complete 8-inch wafers simultaneously in the optical spectrum (1300nm and 1550nm) and radio frequency (DC to 110 GHz), applying extreme temperatures based on the regulations that the device under test must comply with.
The applications this equipment will focus on will test the final functionality of RF and/or photonic circuits included in microprocessors and chips, lasers, modulators, and photodetectors for high-speed telecommunications systems, or advanced circuit testing for space and defense topics, since the thermal range it covers is a requirement in many current regulations.
Having equipment with these characteristics would facilitate access for the institute's research groups to competitive research projects that is currently hindered by the lack of such equipment. The requested infrastructure would position NTC's facilities at the forefront of technology and alongside leading centers in photonics and communications.


LOT-0000
Probing Station Equipment (“PROBE SYSTEM”) for Optical, DC, and Automatic RF Characterization at Temperature for 8” Wafers.
The Nanophotonics Technology Institute (NTC) of UPV is proposing the acquisition of a semi-automatic hybrid electro-optical characterization equipment, capable of up to 110GHz in a temperature range of -40 degrees to 200 degrees. This technology is key in the verification and testing process of electronic and photonic devices created in the institute's own facilities (Cleanroom) or providing services to external devices, thus closing the cycle in the development of integrated circuits.
This equipment significantly enhances our capabilities as it allows testing circuits from a few millimeters in size to complete 8-inch wafers simultaneously in the optical spectrum (1300nm and 1550nm) and radio frequency (DC to 110 GHz), applying extreme temperatures based on the regulations that the device under test must comply with.
The applications this equipment will focus on will test the final functionality of RF and/or photonic circuits included in microprocessors and chips, lasers, modulators, and photodetectors for high-speed telecommunications systems, or advanced circuit testing for space and defense topics, since the thermal range it covers is a requirement in many current regulations.
Having equipment with these characteristics would facilitate access for the institute's research groups to competitive research projects that is currently hindered by the lack of such equipment. The requested infrastructure would position NTC's facilities at the forefront of technology and alongside leading centers in photonics and communications.

The Buyer:
Rectorado de la Universitat Politècnica de València
Additional information:
Link:
Additional document: Detalle_Licitacion
Link:
View Full Notice
Link:
Download Full Notice as PDF
CPV Code(s):
31712100 - Microelectronic machinery and apparatus