Scanning probe microscopes | Tenderlake

Scanning probe microscopes

Contract Value:
-
Notice Type:
Contract Notice
Published Date:
21 June 2023
Closing Date:
07 August 2023
Location(s):
NL21 Overijssel (NL Netherlands/NEDERLAND)
Description:
Atomic Force Microscope

The University of Twente is tending to purchase an Atomic Force Microscope system.

The AFM will be used to do research mainly onto 2D materials. Many of these materials are sensitive to oxygen and humidity so environmental control during the experiment is required. Quantum effects on the atomic scale will be studied. This requires an AFM that is capable to image topography  and conductivity with atomic resolution. Atomic resolution has to be achieved in air as well as in fluids.

The University of Twente is tending to purchase an Atomic Force Microscope system.

The AFM will be used to do research mainly onto 2D materials. Many of these materials are sensitive to oxygen and humidity so environmental control during the experiment is required. Quantum effects on the atomic scale will be studied. This requires an AFM that is capable to image topography and conductivity with atomic resolution. Atomic resolution has to be achieved in air as well as in fluids.

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The Buyer:
Universiteit Twente
CPV Code(s):
38514200 - Scanning probe microscopes