Scanning probe microscopes | Tenderlake

Scanning probe microscopes

Contract Value:
EUR 420K - 420K
Notice Type:
Contract award notice
Published Date:
16 October 2023
Closing Date:
Location(s):
NL NEDERLAND (NL Netherlands/NEDERLAND)
Description:
Atomic Force Microscope

The University of Twente is tending to purchase an Atomic Force Microscope system.

The AFM will be used to do research mainly onto 2D materials. Many of these materials are sensitive to oxygen and humidity so environmental control during the experiment is required. Quantum effects on the atomic scale will be studied. This requires an AFM that is capable to image topography  and conductivity with atomic resolution. Atomic resolution has to be achieved in air as well as in fluids.

The University of Twente is tending to purchase an Atomic Force Microscope system.

The AFM will be used to do research mainly onto 2D materials. Many of these materials are sensitive to oxygen and humidity so environmental control during the experiment is required. Quantum effects on the atomic scale will be studied. This requires an AFM that is capable to image topography  and conductivity with atomic resolution. Atomic resolution has to be achieved in air as well as in fluids.

Awarded to:
1
Oxford Instruments GmbH, Wiesbaden (DE)
Download full details as .pdf
The Buyer:
Universiteit Twente
CPV Code(s):
38514200 - Scanning probe microscopes