- The purpose of this contract is the acquisition, installation and operation of a scanning electron microscope with a field emission source for characterization of materials with EDX and EBSD (FEGSEM), the characteristics of which are specified in the Technical Specifications. Individuals.

- As detailed in the Technical Specification Sheet, the contract includes the assembly and operation of the equipment at the Foundation's headquarters, the necessary training for its use and full maintenance during the warranty period.

The object of the contract is the acquisition, installation and commissioning of a FEGSEM equipment at the Imdea Materials Institute, in accordance with the technical prescriptions contained in this document. This microscope is intended to be a versatile instrument to be used in the microstructural study of very diverse structural and functional materials, both conductive and non-conductive, in order to determine microstructural, chemical and crystallographic magnitudes at the nanometric level. That is why the microscope must include technical proposals that allow working with both conductive and non-conductive samples without the need to be coated, including several secondary electron (SE) and backscattered electron (BSE) detectors compatible with the different modes of use. , in addition to having detectors for performing X-ray energy dispersive spectroscopy (EDS) and backscattered electron diffraction (EBSD).