Supply of a single-crystal R-X diffractometer with dual radiation source (Cu and Mo) and automatic sample loading system to the X-ray Unit

Supply of a single-crystal R-X diffractometer with dual radiation source (Cu and Mo) and automatic sample loading system to the X-ray Unit in order to extend the measurement capabilities of single-crystal R-X diffraction, both quantitatively and qualitatively of the X-ray Unit, allowing automation in the assembly and characterization of samples and remote management of equipment