supply and installation of a Focused Ion Beam Double Microscope – Electronic Scanning (FIB-SEM) for the Department of Engineering, according to the legal regulations governing the specific sector, as detailed in the Technical Specifications
supply and installation of a Focused Ion Beam Double Microscope – Electronic Scanning (FIB-SEM) for the Department of Engineering, according to the legal regulations governing the specific sector, as detailed in the Technical Specifications